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Advanced MicroAnalytical Now Offers Cross Sectional Analysis Techniques

Advanced MicroAnalytical offers solutions to a more in-depth analysis beyond a simple surface examination by using Cross Sectional Analysis Techniques.

Salem, NH, December 14th, 2020 Cross sectional analysis is a technique used when a more in-depth analysis beyond a simple surface examination is required. It is a key technique in failure analysis and electronics inspection. The type of cross sectional analysis can be used differently for each project, ranging from discrete, micrometer size areas to whole devices or boards allowing examination of sub-structure across the entire device. With mechanical cross sections, samples can be mounted in epoxy and vacuum impregnated to provide a support.......[Read More] [All News]

FDA Publishes Nanotechnology Report and Pioneering Nanomaterial Testing Services to Advance Research and Industry

Advanced MicroAnalytical offers solutions to nanomaterial testing challenges to support research and development efforts and the production of innovative materials and products.

Salem, NH, November 16th, 2020 Earlier this year, the U.S. Food and Drug Administration (FDA) published Nanotechnology - Over a Decade of Progress and Innovation. Nanotechnology, which is science, engineering and technology conducted at the nanoscale, is a rapidly emerging field that brings countless new benefits, possibilities and challenges to society and industry. Nanotechnology utilizing nanomaterials, also referred to as nanoparticles, is a rapidly growing component of modern industry and medical research. Nanomaterials come.......[Read More] [All News]

Determining the Elemental Composition of Materials Utilizing X-Ray Fluorescence

Advanced MicroAnalytical provides testing services utilizing XRF and other cutting-edge techniques to provide clients with answers and solutions to a wide range of material challenges.

Salem, NH, November 11th, 2020 X-ray fluorescence (XRF) provides elemental compositional analysis of bulk samples using a non-destructive elemental analysis technique. It can be used to analyze the elemental composition of liquids, solids and loose powders. A combination of high accuracy, precision and brisk sample preparation make XRF a preferred elemental analytical technique for many of the clients that depend on Advanced MicroAnalytical to find answers for their material science needs. The high range of sensitivity and typically.......[Read More] [All News]

X-Ray Material Imaging Provides Industry with Precise Details of Internal Structures and Features

Advanced MicroAnalytical offers X-ray imaging, 3D X-ray CT and other exacting material testing services to support a wide range of industries.

Salem, NH, October 22nd, 2020 X-ray imaging is a well-known method for examining the internal structural composition of a material in a nondestructive manner. This can be achieved because X-rays penetrate most substances and are only absorbed by relatively dense materials, allowing the inside of many materials to be examined without destroying or damaging it. As an inspection tool, X-rays are often used to document internal structures and measure parts. With the substantial range of magnifications possible with a modern industrial X-ray.......[Read More] [All News]

Identification and Characterization of Crystalline Materials Utilizing X-Ray Diffraction

Advanced MicroAnalytical provides precision testing services utilizing XRD and other advanced techniques to provide clients with answers and solutions to material challenges.

Salem, NH, September 29th, 2020 X-ray diffraction (XRD) is a technique that is widely used today for the identification and characterization of crystalline materials. It is a rapid and nondestructive technique based on Bragg’s law that can offer scientists and engineers a wealth of information when examining crystalline materials. Due to the long-range order of the atoms or molecules in the structure of crystalline materials, a sample will generate unique diffraction patterns when irradiated with X-rays. These patterns can then be.......[Read More] [All News]

Identifying Microplastics to Support Industry and Environmental Research Efforts

Advanced MicroAnalytical offers Fourier Transform Infrared Spectroscopy and other material testing services to identify and quantify microplastics.

Salem, NH, September 4th, 2020 Microplastics have been manufactured for use in drug delivery and products such as cosmetics. They are also considered a potential environmental hazard by many scientists. Described by the U.S. National Oceanic and Atmospheric Administration (NOAA) as plastic fragments less than 5 mm in length, microplastics are further categorized into primary and secondary microplastics. Primary microplastics include microbeads, plastic pellets and other manufactured raw plastic materials. Secondary microplastics are created.......[Read More] [All News]

Transmission Electron Microscopy Services from Advanced MicroAnalytical Provide Industry with Detailed Images and the Answers to Material Challenges

Advanced MicroAnalytical offers material and surface testing solutions utilizing TEM and other advanced techniques.

Salem, NH, August 26th, 2020   Transmission electron microscopy (TEM) is a scientific technique used for imaging and analysis of structure and morphology at exceptionally high resolutions using an electron beam transmitted through a very small or thin prepared section of a sample. TEM creates images of samples at magnifications far surpassing the capabilities of optical microscopy, even down to atomic lattice line structure resolution. TEM with energy-dispersive X-ray analysis (EDX), along with scanning electron microscopy (SEM) with.......[Read More] [All News]

X-Ray Photoelectron Spectroscopy is a Powerful Technique Used by Industry to Analyze the Surface Chemistry of Materials

Advanced MicroAnalytical offers X-ray photoelectron spectroscopy and other cutting edge testing services to support the material and surface engineering needs of clients in many industries.

Salem, NH, August 18th, 2020   X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), is an important tool used for surface science and determining the chemical analysis of a wide range of materials. XPS allows for an extensive variety of elements to not only be identified and quantified, but also for chemical state information regarding these elements to be determined. XPS works by bombarding a vacuum stable sample with a concentrated beam of X-rays. This allows for the interaction.......[Read More] [All News]

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