Contamination Analysis Services for Manufacturing

Unwanted material, FOD and general contamination can take many forms and can have a significant impact on processes, productivity and quality.  Contamination can lead to failures or rejections.

It can come in the form of trace residues, embedded material, surface particulate or defects.  Advanced MicroAnalytical uses a range of microscopy methods, ranging from optical to spectral imaging, fluorescence and electron microscopy to provide critical information for identification and determining the source of contaminants.

Our team of analysts can examine all of the varying components of any dust, residues, or contamination using forensic techniques and chemical analysis methods such as cross sectioning, direct examination, FIB sectioning, Micro FTIR, Raman or X-ray spectroscopy to identify individual particles, embedded FOD or aggregates. Here at Advanced MicroAnalytical, we have a host of services to meet your needs and the breadth of experience to handle any size or type of project. Contact us today and let us start providing you with solutions to your technical challenges no matter where your needs lie.

Whether your request is Cross contamination, storage or transportation issues, process control or manufacturing defects, or simple customer complaints, Advanced MicroAnalytical has you covered with analysis options that can be rapidly deployed like:

• CID Contamination Identification using special preparation techniques and chemical identification using standard forensic techniques.
• X-Sectional Analysis or Subsurface analysis: Cross sectional analysis – using standard mechanical section or FIB sectioning for analysis of subsurface defects or contamination across a wide variety of materials and components. XS Analysis
• Particulate Micro-Analysis (PMA Level 2): Analysis and classification of microscopic particles by light microscopy and *Scanning Electron Microscopy (SEM)/Energy Dispersive X-Ray Spectroscopy (EDS)/ Fourier Transform Infrared Spectroscopy (FTIR) analysis (*as determined by sample) Particulate Micro Analysis
  Particulate Micro-Analysis (PMA Level 1) Optical Only: Analysis and classification of particles by light microscopy.
• Hi-Volume Filter Analysis for Analytes: Optical microscopy analysis of particles captured from high-volume
  fiberglass filter to determine weight percentage of particle categories.
• Mixture Quantification by Mass Fraction: Mass fraction analysis by SEM/EDS.
• Industrial Burner Residue: Particle analysis to identify soot associated with industrial burner residues
  Stack Residue Material Analysis: Analysis of solid residues to determine source of buildup in a stack, filter, or scrubber.Power Generation = Industrial Burner Residue Analysis
• Polymer Analysis: Micro FTIR or Raman spectroscopy of polymers or coatings.Polymer Testing
• Custom Analysis Options: We also provide customized analysis options on surface, air or bulk samples as well as residues, by-products and other materials.